Semiconductor Engineers Get Relief from Complex Test Setup Headaches with Reconfigurable Solutions

Semiconductor Engineers Find Relief with Reconfigurable Test Setups A recent webinar explored the challenges of testing complex semiconductor devices and presented efficient techniques for analog and mixed-signal device testing using reconfigurable test setups. The event, held on October 2, 2025, was hosted by Liquid Instruments and featured a product marketing manager as the keynote speaker. According to Jessica Patterson, Product Marketing Manager at Liquid Instruments, "Semiconductor devices are becoming increasingly complex, making it difficult for engineers to validate performance and catch edge cases under tight schedules." To address this challenge, multi-channel test setups designed for flexibility and performance can help engineers scale effectively. These reconfigurable test setups integrate multiple instruments, reducing signal path complexity and improving data fidelity when measuring mixed-signal device-under-test (DUT) response. The webinar highlighted the importance of building efficient parallel test setups to increase throughput. Patterson noted that "example test setups for common semiconductor validation tests can be configured using these reconfigurable test setups." This approach allows engineers to reduce testing time, improve accuracy, and meet the growing demands of the semiconductor industry. Background context is essential in understanding the significance of this development. The increasing complexity of semiconductor devices has led to a surge in demand for efficient testing methods. As Patterson explained, "test setups often include oscilloscopes, waveform generators, network analyzers, and more, potentially from different vendors with unique automation and configuration considerations." This diversity of equipment can make it challenging for engineers to configure and control test setups. Additional perspectives on the topic were provided by industry experts who attended the webinar. While some attendees expressed concerns about the cost and complexity of implementing reconfigurable test setups, others saw the benefits in terms of increased efficiency and accuracy. The current status of this development is promising, with several companies already adopting reconfigurable test setups for their semiconductor testing needs. As Patterson noted, "the use of these reconfigurable test setups is expected to grow as more engineers recognize the benefits of efficient, accurate, and scalable testing methods." In conclusion, the webinar on configuring and controlling complex test equipment setups for silicon device test and characterization has shed light on a pressing issue in the semiconductor industry. With the increasing complexity of devices, reconfigurable test setups offer a promising solution to the challenges faced by engineers. As Patterson emphasized, "the future of semiconductor testing lies in efficient, flexible, and scalable methods that can keep pace with the growing demands of the industry." *Reporting by Events.*