Engineers Unleash Efficiency: Taming Complex Test Equipment for Silicon Device Testing

Engineers Find New Ways to Tame Complex Test Equipment for Silicon Device Testing In a recent webinar, industry experts shared innovative techniques for configuring and controlling complex test equipment setups, helping engineers tackle the challenge of validating performance in increasingly sophisticated semiconductor devices. The virtual event, held on October 2, 2025, highlighted efficient methods for analog and mixed-signal device testing using reconfigurable test setups. According to Jessica Patterson, product marketing manager at Liquid Instruments, "As semiconductor devices grow more complex, engineers face the daunting task of validating performance and catching edge cases under tight schedules." To address this challenge, multi-channel test setups designed for flexibility and performance can help engineers scale effectively. The webinar focused on reducing signal path complexity with multiple integrated instruments, improving data fidelity when measuring mixed-signal DUT response, and building efficient parallel test setups to increase throughput. Patterson emphasized the importance of configuring example test setups for common semiconductor validation tests. "By leveraging reconfigurable test equipment, engineers can streamline their workflows, reduce costs, and accelerate time-to-market," she explained. The webinar's key learnings were developed in collaboration with industry experts who have extensive experience in silicon device testing and characterization. The event provided a platform for sharing knowledge, best practices, and real-world applications of reconfigurable test equipment in semiconductor validation. In addition to Patterson, the webinar featured other industry experts who shared their insights on the latest trends and innovations in test equipment configuration and control. Their presentations highlighted the potential benefits of adopting reconfigurable test setups, including improved accuracy, increased throughput, and reduced costs. The current status of silicon device testing is marked by increasing complexity, driven by advances in semiconductor technology. As devices become more sophisticated, engineers face significant challenges in validating performance and catching edge cases. The webinar's focus on efficient, accurate, and scalable techniques for analog and mixed-signal device testing using reconfigurable test setups offers a promising solution to this challenge. Looking ahead, the adoption of reconfigurable test equipment is expected to continue growing as manufacturers seek to optimize their workflows, reduce costs, and accelerate time-to-market. As Patterson noted, "The webinar provided a valuable resource for engineers seeking to stay up-to-date with the latest trends and innovations in silicon device testing." *Reporting by Events.*